Author
Charnigo, R., Francoeur, M., Kenkel, P., Mengüç, Mustafa Pınar, Hall, B., Srinivasan, C.
Publication Date
2011-05
Publication Place
-
Elsevier
Subject
Characterization, Compound estimator, Evanescent wave, Direct problem, Inverse problem, Scattering profile
Type
Periodical
Language
English
Digital
Yes
Manuscript
No
Library
Özyeğin University
Library Asset ID
0022-4073
Record ID
6a0458c5-1703-4541-9f2c-546793e11ce6
Library Location
Mechanical Engineering
Date
2011-05
Notes
Due to copyright restrictions, the access to the full text of this article is only available via subscription.
Sample Text
Characterization of nanoparticles on surfaces is a challenging in verse problem whose solution has many practical applications. This article proposes a method, suitable for in situ characterization systems, for estimating quantitative features of nanoparticles on surfaces from scattering profiles and their derivatives. Our method enjoys a number of advantages over competing approaches to this inverse problem. One such advantage is that only a partial solution is required for the companion direct problem. For example, estimating the average diameter of nanoparticles to be 53 nm is possible even when a researcher’s existing scattering data pertain to nanoparticles whose average diameters are in multiples of 5 nm. Two numerical studies illustrate the implementation and performance of our method for inferring nanoparticle diameters and agglomeration levels respectively.
DOI
10.1016/j.jqsrt.2011.01.019
Cilt
112
