Author
Elfadel, I. A. M., Uğurdağ, Hasan Fatih
Publication Date
2018-02
Publication Place
-
IEEE
Type
Periodical
Language
English
Digital
Yes
Manuscript
No
Library
Özyeğin University
Library Asset ID
2168-2356
Record ID
8e5981e1-4dc8-4ced-981a-ff3446929ee6
Library Location
Electrical & Electronics Engineering
Date
2018-02
Notes
IEEE Test Technology Technical Council ; IEEE Solid State Circuits Society
Sample Text
The 25th IFIP/IEEE Conference on Very Large Scale Integration (VLSI-SoC 2017) was held between 23 and 25 October in the landmark Yas Viceroy Hotel, overlooking the Formula 1 Yas Marina racetrack in Yas Island, Abu Dhabi, United Arab Emirates (UAE). The conference was held under the overarching theme: “The Internet of Things: SoC Challenges and Opportunities,” and featured four keynote addresses on this topic by renowned leaders from industry and academia, including Dr. Yervant Zorian, Synopsys Fellow and President of Synopsys Armenia, Dr. Rafic Makki, Executive Fellow, GLOBALFOUNDRIES, Dr. Leon Stok, VP EDA, IBM, and Prof. Simha Sethumadhavan, Columbia University. Prof. Tod A. Laursen, President of Khalifa University of Science and Technology gave the Welcome Address at the Opening Session.
DOI
10.1109/MDAT.2017.2783194
Cilt
35