Lower uncertainty bounds of diffraction-based nanoparticle sizes

Name: Lower uncertainty bounds of diffraction-based nanoparticle sizes
Author: Noyan, İ. C., Öztürk, Hande

İsim	Lower uncertainty bounds of diffraction-based nanoparticle sizes
Yazar	Noyan, İ. C., Öztürk, Hande
Basım Tarihi:	2022-06
Basım Yeri	- Wiley
Konu	Diffraction, Fourier analysis, Integral breadth, Particle size determination, Scherrer approach
Tür	Süreli Yayın
Dil	İngilizce
Dijital	Evet
Yazma	Hayır
Kütüphane:	Özyeğin Üniversitesi
Demirbaş Numarası	0021-8898
Kayıt Numarası	66c0d484-0f92-4401-a981-0713f735164f
Lokasyon	Mechanical Engineering
Tarih	2022-06
Notlar	TÜBİTAK
Örnek Metin	A self-consistent analysis is reported of traditional diffraction-based particle size determination techniques applied to synthetic diffraction profiles generated with the Patterson approach. The results show that dimensions obtained from traditional techniques utilizing peak fitting or Fourier analysis for single-crystal nanoparticles have best-case error bounds of around 5%. For arbitrarily shaped particles, lower error magnitudes are possible only if the zeroes of the thickness fringes are used. The errors for sizes obtained by integral-breadth-And Fourier-decomposition-based techniques depend on the shape of the diffracting domains. In the case of integral-breadth analysis, crystal shapes which scatter more intensity into the central peak of the rocking curve have lower size errors. For Fourier-decomposition analysis, crystals which have non-uniform distributions of chord lengths exhibit nonlinearities in the initial ranges of the normalized Fourier cosine coefficient versus column length (\|A L \| versus L) plots, even when the entire rocking curve is used in the decomposition. It is recommended that, in routine analysis, all domain size determination techniques should be applied to all reflections in a diffraction pattern. If there is significant divergence among these results, the 'average particle size(s)' obtained might not be reliable.
DOI	10.1107/S1600576722002564
Cilt	55

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Lower uncertainty bounds of diffraction-based nanoparticle sizes

Yazar Noyan, İ. C., Öztürk, Hande

Basım Tarihi 2022-06

Basım Yeri - Wiley

Konu Diffraction, Fourier analysis, Integral breadth, Particle size determination, Scherrer approach

Tür Süreli Yayın

Dil İngilizce

Dijital Evet

Yazma Hayır

Kütüphane Özyeğin Üniversitesi

Demirbaş Numarası 0021-8898

Kayıt Numarası 66c0d484-0f92-4401-a981-0713f735164f

Lokasyon Mechanical Engineering

Tarih 2022-06

Notlar TÜBİTAK

Örnek Metin A self-consistent analysis is reported of traditional diffraction-based particle size determination techniques applied to synthetic diffraction profiles generated with the Patterson approach. The results show that dimensions obtained from traditional techniques utilizing peak fitting or Fourier analysis for single-crystal nanoparticles have best-case error bounds of around 5%. For arbitrarily shaped particles, lower error magnitudes are possible only if the zeroes of the thickness fringes are used. The errors for sizes obtained by integral-breadth-And Fourier-decomposition-based techniques depend on the shape of the diffracting domains. In the case of integral-breadth analysis, crystal shapes which scatter more intensity into the central peak of the rocking curve have lower size errors. For Fourier-decomposition analysis, crystals which have non-uniform distributions of chord lengths exhibit nonlinearities in the initial ranges of the normalized Fourier cosine coefficient versus column length (|A L | versus L) plots, even when the entire rocking curve is used in the decomposition. It is recommended that, in routine analysis, all domain size determination techniques should be applied to all reflections in a diffraction pattern. If there is significant divergence among these results, the 'average particle size(s)' obtained might not be reliable.

DOI 10.1107/S1600576722002564

Cilt 55