Estimating quantitative features of nanoparticles using multiple derivatives of scattering profiles

Name: Estimating quantitative features of nanoparticles using multiple derivatives of scattering profiles
Author: Charnigo, R., Francoeur, M., Kenkel, P., Mengüç, Mustafa Pınar, Hall, B., Srinivasan, C.

İsim	Estimating quantitative features of nanoparticles using multiple derivatives of scattering profiles
Yazar	Charnigo, R., Francoeur, M., Kenkel, P., Mengüç, Mustafa Pınar, Hall, B., Srinivasan, C.
Basım Tarihi:	2011-05
Basım Yeri	- Elsevier
Konu	Characterization, Compound estimator, Evanescent wave, Direct problem, Inverse problem, Scattering profile
Tür	Süreli Yayın
Dil	İngilizce
Dijital	Evet
Yazma	Hayır
Kütüphane:	Özyeğin Üniversitesi
Demirbaş Numarası	0022-4073
Kayıt Numarası	6a0458c5-1703-4541-9f2c-546793e11ce6
Lokasyon	Mechanical Engineering
Tarih	2011-05
Notlar	Due to copyright restrictions, the access to the full text of this article is only available via subscription.
Örnek Metin	Characterization of nanoparticles on surfaces is a challenging in verse problem whose solution has many practical applications. This article proposes a method, suitable for in situ characterization systems, for estimating quantitative features of nanoparticles on surfaces from scattering profiles and their derivatives. Our method enjoys a number of advantages over competing approaches to this inverse problem. One such advantage is that only a partial solution is required for the companion direct problem. For example, estimating the average diameter of nanoparticles to be 53 nm is possible even when a researcher’s existing scattering data pertain to nanoparticles whose average diameters are in multiples of 5 nm. Two numerical studies illustrate the implementation and performance of our method for inferring nanoparticle diameters and agglomeration levels respectively.
DOI	10.1016/j.jqsrt.2011.01.019
Cilt	112

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Estimating quantitative features of nanoparticles using multiple derivatives of scattering profiles

Yazar Charnigo, R., Francoeur, M., Kenkel, P., Mengüç, Mustafa Pınar, Hall, B., Srinivasan, C.

Basım Tarihi 2011-05

Basım Yeri - Elsevier

Konu Characterization, Compound estimator, Evanescent wave, Direct problem, Inverse problem, Scattering profile

Tür Süreli Yayın

Dil İngilizce

Dijital Evet

Yazma Hayır

Kütüphane Özyeğin Üniversitesi

Demirbaş Numarası 0022-4073

Kayıt Numarası 6a0458c5-1703-4541-9f2c-546793e11ce6

Lokasyon Mechanical Engineering

Tarih 2011-05

Notlar Due to copyright restrictions, the access to the full text of this article is only available via subscription.

Örnek Metin Characterization of nanoparticles on surfaces is a challenging in verse problem whose solution has many practical applications. This article proposes a method, suitable for in situ characterization systems, for estimating quantitative features of nanoparticles on surfaces from scattering profiles and their derivatives. Our method enjoys a number of advantages over competing approaches to this inverse problem. One such advantage is that only a partial solution is required for the companion direct problem. For example, estimating the average diameter of nanoparticles to be 53 nm is possible even when a researcher’s existing scattering data pertain to nanoparticles whose average diameters are in multiples of 5 nm. Two numerical studies illustrate the implementation and performance of our method for inferring nanoparticle diameters and agglomeration levels respectively.

DOI 10.1016/j.jqsrt.2011.01.019

Cilt 112