Credible intervals for nanoparticle characteristics

Name: Credible intervals for nanoparticle characteristics
Author: Charnigo, R., Francoeur, M., Kenkel, P., Mengüç, Mustafa Pınar, Hall, B., Srinivasan, C.

İsim	Credible intervals for nanoparticle characteristics
Yazar	Charnigo, R., Francoeur, M., Kenkel, P., Mengüç, Mustafa Pınar, Hall, B., Srinivasan, C.
Basım Tarihi:	2012-01
Basım Yeri	- Elsevier
Konu	Bayesian, Compound estimation, Confidence interval, Scattering, Sufficient statistic, Surface plasmon-polariton
Tür	Süreli Yayın
Dil	İngilizce
Dijital	Evet
Yazma	Hayır
Kütüphane:	Özyeğin Üniversitesi
Demirbaş Numarası	0022-4073
Kayıt Numarası	eb1d49fd-c1e5-4415-8d8c-aee89e7ab7d5
Lokasyon	Mechanical Engineering
Tarih	2012-01
Notlar	NSF
Örnek Metin	Solving the inverse problem of nanoparticle characterization has the potential to advance science and benefit society. While considerable progress has been made within a framework based on the scattering of surface plasmon-polaritons, an aspect not heretofore considered is the quantification of uncertainty in the estimation of a nanoparticle characteristic. Therefore, the present article offers a technique by which an investigator may augment an estimate of a nanoparticle characteristic with a companion “credible interval”. Analogous to the familiar confidence interval but arising from within the Bayesian statistical paradigm, a credible interval allows the investigator to make a statement such as “the nanoparticle diameter lies between 36 and 48 nm with 95% probability” instead of merely “the nanoparticle diameter is estimated to be 42 nm”. Our technique may even be applied outside of the surface plasmon-polariton scattering framework, as long as the investigator specifies his/her prior beliefs about the nanoparticle characteristic and indicates which potential outcomes are likely or unlikely in whatever experiment he/she designs to estimate the nanoparticle characteristic. Two numerical studies illustrate the implementation and performance of our technique in constructing ranges of likely values for nanoparticle diameters and agglomeration levels, respectively.
DOI	10.1016/j.jqsrt.2011.10.006
Cilt	113

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Credible intervals for nanoparticle characteristics

Yazar Charnigo, R., Francoeur, M., Kenkel, P., Mengüç, Mustafa Pınar, Hall, B., Srinivasan, C.

Basım Tarihi 2012-01

Basım Yeri - Elsevier

Konu Bayesian, Compound estimation, Confidence interval, Scattering, Sufficient statistic, Surface plasmon-polariton

Tür Süreli Yayın

Dil İngilizce

Dijital Evet

Yazma Hayır

Kütüphane Özyeğin Üniversitesi

Demirbaş Numarası 0022-4073

Kayıt Numarası eb1d49fd-c1e5-4415-8d8c-aee89e7ab7d5

Lokasyon Mechanical Engineering

Tarih 2012-01

Notlar NSF

Örnek Metin Solving the inverse problem of nanoparticle characterization has the potential to advance science and benefit society. While considerable progress has been made within a framework based on the scattering of surface plasmon-polaritons, an aspect not heretofore considered is the quantification of uncertainty in the estimation of a nanoparticle characteristic. Therefore, the present article offers a technique by which an investigator may augment an estimate of a nanoparticle characteristic with a companion “credible interval”. Analogous to the familiar confidence interval but arising from within the Bayesian statistical paradigm, a credible interval allows the investigator to make a statement such as “the nanoparticle diameter lies between 36 and 48 nm with 95% probability” instead of merely “the nanoparticle diameter is estimated to be 42 nm”. Our technique may even be applied outside of the surface plasmon-polariton scattering framework, as long as the investigator specifies his/her prior beliefs about the nanoparticle characteristic and indicates which potential outcomes are likely or unlikely in whatever experiment he/she designs to estimate the nanoparticle characteristic. Two numerical studies illustrate the implementation and performance of our technique in constructing ranges of likely values for nanoparticle diameters and agglomeration levels, respectively.

DOI 10.1016/j.jqsrt.2011.10.006

Cilt 113