Resolving 500 nm axial separation by multi-slice X-ray ptychography

Name: Resolving 500 nm axial separation by multi-slice X-ray ptychography
Author: Huang, X., Yan, H., Ge, M., Öztürk, Hande, Fang, Y.-L. L., Ha, S., Lin, M., Lu, M., Nazaretski, E., Robinson, I. K., Chu, Y. S.

İsim	Resolving 500 nm axial separation by multi-slice X-ray ptychography
Yazar	Huang, X., Yan, H., Ge, M., Öztürk, Hande, Fang, Y.-L. L., Ha, S., Lin, M., Lu, M., Nazaretski, E., Robinson, I. K., Chu, Y. S.
Basım Tarihi:	2019-03
Basım Yeri	- International Union of Crystallography
Konu	X-ray ptychography, Multi-slice approach, Nanostructures
Tür	Süreli Yayın
Dil	İngilizce
Dijital	Evet
Yazma	Hayır
Kütüphane:	Özyeğin Üniversitesi
Demirbaş Numarası	2053-2733
Kayıt Numarası	4cc683e6-d27a-4060-b6b0-75a0ed2647c4
Lokasyon	Mechanical Engineering
Tarih	2019-03
Notlar	Laboratory Directed Research and Development program from the Brookhaven National Laboratory ; United States Department of Energy (DOE)
Örnek Metin	Multi-slice X-ray ptychography offers an approach to achieve images with a nanometre-scale resolution from samples with thicknesses larger than the depth of field of the imaging system by modeling a thick sample as a set of thin slices and accounting for the wavefront propagation effects within the specimen. Here, we present an experimental demonstration that resolves two layers of nanostructures separated by 500 nm along the axial direction, with sub-10 nm and sub-20 nm resolutions on two layers, respectively. Fluorescence maps are simultaneously measured in the multi-modality imaging scheme to assist in decoupling the mixture of low-spatial-frequency features across different slices. The enhanced axial sectioning capability using correlative signals obtained from multi-modality measurements demonstrates the great potential of the multi-slice ptychography method for investigating specimens with extended dimensions in 3D with high resolution.
DOI	10.1107/S2053273318017229
Cilt	75

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Resolving 500 nm axial separation by multi-slice X-ray ptychography

Yazar Huang, X., Yan, H., Ge, M., Öztürk, Hande, Fang, Y.-L. L., Ha, S., Lin, M., Lu, M., Nazaretski, E., Robinson, I. K., Chu, Y. S.

Basım Tarihi 2019-03

Basım Yeri - International Union of Crystallography

Konu X-ray ptychography, Multi-slice approach, Nanostructures

Tür Süreli Yayın

Dil İngilizce

Dijital Evet

Yazma Hayır

Kütüphane Özyeğin Üniversitesi

Demirbaş Numarası 2053-2733

Kayıt Numarası 4cc683e6-d27a-4060-b6b0-75a0ed2647c4

Lokasyon Mechanical Engineering

Tarih 2019-03

Notlar Laboratory Directed Research and Development program from the Brookhaven National Laboratory ; United States Department of Energy (DOE)

Örnek Metin Multi-slice X-ray ptychography offers an approach to achieve images with a nanometre-scale resolution from samples with thicknesses larger than the depth of field of the imaging system by modeling a thick sample as a set of thin slices and accounting for the wavefront propagation effects within the specimen. Here, we present an experimental demonstration that resolves two layers of nanostructures separated by 500 nm along the axial direction, with sub-10 nm and sub-20 nm resolutions on two layers, respectively. Fluorescence maps are simultaneously measured in the multi-modality imaging scheme to assist in decoupling the mixture of low-spatial-frequency features across different slices. The enhanced axial sectioning capability using correlative signals obtained from multi-modality measurements demonstrates the great potential of the multi-slice ptychography method for investigating specimens with extended dimensions in 3D with high resolution.

DOI 10.1107/S2053273318017229

Cilt 75