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Developing a standard measurement and calculation procedure for high brightness LED junction temperature

İsim Developing a standard measurement and calculation procedure for high brightness LED junction temperature
Yazar Arık, Mehmet, Kulkarni, K. S., Royce, C., Weaver, S.
Basım Tarihi: 2014
Konu LED junction temperature, Forward voltage, Wavelength shift, Thermal transient behavior
Tür Belge
Dil İngilizce
Dijital Evet
Yazma Hayır
Kütüphane: Özyeğin Üniversitesi
Demirbaş Numarası 1087-9870
Kayıt Numarası 389990fd-90cc-4f7d-8abb-000c29f92be6
Lokasyon Mechanical Engineering
Tarih 2014
Notlar Due to copyright restrictions, the access to the full text of this article is only available via subscription.
Örnek Metin White light emitting diodes (LEDs) are appearing in general illumination applications. Clusters of such LEDs can replace an incandescent light bulb of equal luminosity on the merit of considerably low power consumption. However the optical performance and working life of these LED packages are strongly dependent on the temperature of the p-n junction of the LED. Hence it is very critical to determine the temperature of the junction. Three methods - forward voltage change, peak wavelength shift and infrared thermal imaging are employed to determine the junction temperature. Forward voltage change method is found to be the most accurate method (± 3 °C) for an optimized set of parameters. Analytical model is proposed for the thermal transient behavior of the LED junction and the predictions are compared with experimental results. A good agreement is observed between that of two experimental methods. Thermal resistance of the LED package is estimated analytically and experimentally. Experimental values show a larger variation than expected through material property variation.
DOI 10.1109/ITHERM.2014.6892277
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Developing a standard measurement and calculation procedure for high brightness LED junction temperature

Yazar Arık, Mehmet, Kulkarni, K. S., Royce, C., Weaver, S.
Basım Tarihi 2014
Konu LED junction temperature, Forward voltage, Wavelength shift, Thermal transient behavior
Tür Belge
Dil İngilizce
Dijital Evet
Yazma Hayır
Kütüphane Özyeğin Üniversitesi
Demirbaş Numarası 1087-9870
Kayıt Numarası 389990fd-90cc-4f7d-8abb-000c29f92be6
Lokasyon Mechanical Engineering
Tarih 2014
Notlar Due to copyright restrictions, the access to the full text of this article is only available via subscription.
Örnek Metin White light emitting diodes (LEDs) are appearing in general illumination applications. Clusters of such LEDs can replace an incandescent light bulb of equal luminosity on the merit of considerably low power consumption. However the optical performance and working life of these LED packages are strongly dependent on the temperature of the p-n junction of the LED. Hence it is very critical to determine the temperature of the junction. Three methods - forward voltage change, peak wavelength shift and infrared thermal imaging are employed to determine the junction temperature. Forward voltage change method is found to be the most accurate method (± 3 °C) for an optimized set of parameters. Analytical model is proposed for the thermal transient behavior of the LED junction and the predictions are compared with experimental results. A good agreement is observed between that of two experimental methods. Thermal resistance of the LED package is estimated analytically and experimentally. Experimental values show a larger variation than expected through material property variation.
DOI 10.1109/ITHERM.2014.6892277
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